Quesant Instruments (now an Ambios Technology Company) has for years been a leader in the design and manufacture of scanning probe microscopes (SPMs). Quesant has provided exceptional SPM value to both industry and academia. 

Scanning probe microscopes can probe virtually every mechanical, chemical and electronic property of a sample at the micro- to nano- meter level.     SPM usage continues to grow worldwide as new measurement techniques are discovered and new applications are found. 

Quesant instruments support the following standard scanning modes:

•    Contact atomic force microscopy (C-AFM)
•     Intermittent-contact atomic force microscopy (IC-AFM)
•     Scanning tunneling microscopy (STM)
•      Magnetic force microscopy (MFM)
•      Lateral force microscopy (LFM)
•      Phase contrast imaging
•      Electric force microscopy (EFM)
•      Scanning conductance microscopy (SCM)
•      Liquid cell scanning
   

For applications requiring precise positioning of the probe, or the best possible accuracy in measuring surface feature dimensions, or the ability to perform nanolithography, Quesant offers a metrology scanner option for all models.  Special lithography software is also available.

For the characterization of surfaces via surface indentation and scratching measurements, we provide an interface for the popular Hysitron Triboscope? indentor module.

Contact us here for more information.