Atomic Force Microscopes, Scanning Probe Microscopes, Scanning Tunneling Microcopes and AFM-SPM-STM Prices & Costs. Quesant Instruments (now an Ambios Technology Company), a leader in the design and nanotechnology manufacturer of metrology instruments, equipment and accessories providing affordable and exceptional value to both industry and academia.
Our instruments support the following standard scanning modes:
- Contact atomic force microscopy (C-AFM)
- Intermittent-contact atomic force microscopy (IC-AFM)
- Scanning tunneling microscopy (STM)
- Magnetic force microscopy (MFM)
- Lateral force microscopy (LFM)
- Phase contrast imaging
- Electric force microscopy (EFM)
- Scanning conductance microscopy (SCM)
- Liquid cell scanning
Give us your challenge and contact us here with questions.
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To learn more about Scanning Probe Microscopy, view our
Library's Technical
Notes and
Applications Notes.
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