Polymer layers in cross-sectional scan, 3-D  - samples as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)

Polymer layers in cross-sectional scan, 3-D

 

Polymer layers, named DEFB (composition unknown), form a transparent sandwiched sheet, much like a sheet of mica. The layers were thought to be several hundred nanometers thick. After scanning the sample in cross-section, it is revealled that indeed the layers are about 200nm thick. The sample was scanned on edge after freeze fracturing (which was a sufficient method of sample preparation).

Back to Gallery