Polished SiC crystal, topview and histrogram  - samples as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)

Polished SiC crystal. Topview with roughness data

This SiC crystal was polished with a fine diamond paste. Its surface is an order of magnitude rougher than the homoepitaxially grown surface in the adjacent gallery image. Scanned in contact mode.

Back to Gallery