Polished SiC crystal, topview and histrogram  - samples as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)

SiN film on glass. Scan size 600 nm.

Deposition of this film is one of the manufacturing steps in the production of a flat panel display. The surface roughness was measured to be 8 Å rms. The image was obtained using Wavemode.

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