Scroll down this page to see examples of how Quesant scanning probe microscopes have been used.  
The gallery is updated periodically with new examples as they become available.
Click an image to view it in full size with its accompanying description.
 
 

 

Laser pits

Concentric holes in Aluminum

 
 
  
 

 

 

H0PG  

Gold Dislocation  

 


 

  

 
 

 
 

 

 

  Particles on Sapphire Wafer
 

 


 

  

 
 

 
 
 
 

Biological samples as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)

  

Hair fiber with topography and LFM as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM) Hair Fiber
 

Bacteria encrusted on mineral surface, topview image as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM) Bacteria
 
Dentine / Cementum 
Tooth x_section 
Chicken cell      

 

Ceramics samples as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)
 

PrCe Pellet, 3-D view, 3 um scan as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)
PrCe Pellet
 

PrCe Pellet, 3-D view, 15 um scan as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)
PrCe Pellet
 

Bad sapphire substrate, 3-D as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)
Bad sapphire substrate
 
Good c-axis sapphire substrate, 3-D as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)
Good sapphire substrate
 
 Sapphire Spheres

 

Data Storage Samples as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)

  

Compact disk pits in polymer layer on metal as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)
Compact disk pits
 
40 mm, MFM images of a zip disk as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)
Zip Disk
 

Data patterns on a hard drive surface with density of 6.8 Gb/in2 as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)
Hard Disk
 



 

  

DVD Media, 3D image as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)
DVD
 
DVD Media, image analisis as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)
DVD
 

CDs differe from DVDs by the amount of data they can hold. CD stamper

 

 

Metals Samples as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)

  

Halar corrosion disk, outside and inside corroded area, topview & rms as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)
Halar corrosion disk
 

NASA gold film on epoxy, 3-D view and histogram 5Å rms as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)
NASA
gold film
 

3-D view of grey iron, etched, with graphite inclusions as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)
Etched
Grey iron
 
Topview image of perlitic and hardened grey iron as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)
Grey iron
comparisons
Gold on   mica  
Galvanized Steel  Galvanized Steel      
 

 

Polymers samples as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)

  

Car bumper polymer composite, PMMA and polypropylene as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)
Car bumper polymer composite
 

Cholesteric liquid crystal film / glass, 3-D as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)
Cholesteric
liquid crystal film/glass
 

Polymer layers in cross-sectional scan, 3-D as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)
Polymer layers
 

 Polystyrene-polybutadiene, phase separated, 3-D as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)
Polystyrene polybutadiene
 
Polyvinyl acetate, 2 um scan, 3-D as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)
Polyvinyl acetate
 

Polyvinyl acetate, 8 um scan, 3-D as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)
Polyvinyl acetate
 

Razor blade with discontinuous teflon film, topography and LFM as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)
Razor blade
 

Teflon

Polymer Blend Phase  Polymer growth Polymer blend   Thin film Diamond

 

Printing Samples as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)

  

Topview of glossy dye-sub printer paper as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)
Glossy dye-sub printer paper
 

Topview of glossy inkjet printer paper as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)
Glossy inkjet printer paper
 

Coated  paper   

Regular paper   

 

Refractory and Optical Samples as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)
     

Gallium nitride film on sapphire, 4 um scan, 3-D as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)
Gallium nitride film on sapphire
 

Homoepitaxially grown SiC steps on bulk crystal, 5 um scan, 3-D as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)
Homoepitaxially grown SiC steps on bulk crystal
 
Polished SiC crystal, topview and histrogram as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)
Polished
SiC crystal
 

SiC film on glass for flat panel display application, topview as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)
SiC film on glass for flat panel display application
 

Polished Glass

 

 

Semiconductors Samples as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)
    

Test pattern with narrow & deep trenches as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)
Test pattern

Alumina layer, annealed, with vias, 3-D as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)
IGBT layer
 

Bimodal analysis of step height on failed zero-D refill pattern as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)
 Analysis of
failed zero-D refill pattern
 
Quantum wire line pattern, 3-D and topview as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)
Quantum wire line pattern
 

Failed zero-D refill pattern, large topview of large area as seen through as scanning probe microscope (SPM) and atomic force microscope (AFM)
Failed zero-D refill pattern
 

 

 

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