Atomic Force Microscopy adds a whole new dimension to your laboratory capability. AFM gives you more than SEM's 2-D images of a surface - AFM provides true 3-D topographic images which also yield surface roughness data on the nanometer scale. Consequently, AFM is ideal for characterizing smooth, flat polymer films and coatings. In addition to providing topographic data, AFM can also reveal information such as the relative frictional properties of heterogeneous polymer compounds, and their degree of elasticity.

       When a typical commercial razor blade is used for cutting, a teflon coating on the blade continually erodes until a thin residual layer is all that remains. The continuity of this layer is difficult to resolve with just topography mode, and is impossible to image otherwise; yet, with the use of lateral force mode (LFM), the frictional behavior of the teflon stands out strongly from the metallic substrate, revealing the degree of dispersion of the teflon. In this case, brighter metallic regions are "stickier" than the teflon in Lateral Force Mode. This is intuitively correct, since teflon is often called a "non-stick" material.

       The images below show AFM topographic data acquired on plastic plaques that are composed of material used in the automotive industry. The intent of this work was to simulate and study a visible defect known as "hazing," that renders the component unfit for use. The hazed surface is definitely different from the virgin material, as scratches stand out well.